세부사항 |
50MHz ~ 13.5 GHz
Fast-sweeping built-in synthesized source with optional 1 Hz frequency resol
ution
Integrated switching test set measures all four S-parameters with a single c
onnection
Vector accuracy enhancement
Optional time domain capability computes and displays response versus time o
r distance
Optional Solid State Switch allow simultaneous measurement of forward and re
verse parameters and continuous update of all four S-parameters as required
for two-part error correction
Productivity is enhanced with pass/fail testing, direct printer/plotter outp
ut of results, advanced marker functions, and save/recall of test configurat
ions
Two independent display channels for simultaneous measurement of reflection
and transmission characteristics
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